Industrial Vision · Solar Manufacturing
Diode defect classification
Drop a single diode image. The model returns a Good / Defect verdict, per-class probabilities, and a Grad-CAM overlay highlighting the regions that drove the decision.
Input
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Model
ArchitectureEfficientNet-B0
Classesgood · defect
Input384 × 384 × 3
Device—
Checkpoint—
Awaiting input
No prediction yet
Upload a diode image to run inference. The verdict, class probabilities, and attention overlay will appear here.
Verdict
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Good0.00%
Defect0.00%
Input · 384 px
Grad-CAM · attention
Warm regions contributed most strongly to the predicted class. Overlay is generated by class-activation mapping on the final conv block.